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Multigate Medical Products Pty Ltd carbon nanotube field-effect transistors
Geometric parameters of the 14-nm <t> carbon nanotube field-effect </t> transistor and FinFET.
Carbon Nanotube Field Effect Transistors, supplied by Multigate Medical Products Pty Ltd, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/carbon+nanotube+field-effect+transistors/carbon+nanotube+field+effect+transistors/pmc08747695-87-17-3
Average 90 stars, based on 1 article reviews
carbon nanotube field-effect transistors - by Bioz Stars, 2026-09
90/100 stars

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1) Product Images from "Design and Analysis of Soft Error Rate in FET/CNTFET Based Radiation Hardened SRAM Cell"

Article Title: Design and Analysis of Soft Error Rate in FET/CNTFET Based Radiation Hardened SRAM Cell

Journal: Sensors (Basel, Switzerland)

doi: 10.3390/s22010033

Geometric parameters of the 14-nm  carbon nanotube field-effect  transistor and FinFET.
Figure Legend Snippet: Geometric parameters of the 14-nm carbon nanotube field-effect transistor and FinFET.

Techniques Used:

Simulated virtual source carbon nanotube field effect transistor: ( a ) 3D structure of the VS-CNTFET structure implemented in the SILVACO Atlas TCAD tool, ( b ) cross sectional view of the CNTFET where the 4H-SiC has the property of semiconducting carbon nanotubes, ( c ) cross sectional view of FinFET and ( d ) I–V characteristics extracted from the device.
Figure Legend Snippet: Simulated virtual source carbon nanotube field effect transistor: ( a ) 3D structure of the VS-CNTFET structure implemented in the SILVACO Atlas TCAD tool, ( b ) cross sectional view of the CNTFET where the 4H-SiC has the property of semiconducting carbon nanotubes, ( c ) cross sectional view of FinFET and ( d ) I–V characteristics extracted from the device.

Techniques Used:

Related Articles

other:

Article Title: Design and Analysis of Soft Error Rate in FET/CNTFET Based Radiation Hardened SRAM Cell
Article Snippet: Compared to the multigate FinFET and conventional sub-22 nm silicon FET, the gate-all-around technique used in the carbon nanotube field-effect transistors downplays other transistors in terms of power consumption and reliability.



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Image Search Results


Geometric parameters of the 14-nm  carbon nanotube field-effect  transistor and FinFET.

Journal: Sensors (Basel, Switzerland)

Article Title: Design and Analysis of Soft Error Rate in FET/CNTFET Based Radiation Hardened SRAM Cell

doi: 10.3390/s22010033

Figure Lengend Snippet: Geometric parameters of the 14-nm carbon nanotube field-effect transistor and FinFET.

Article Snippet: Compared to the multigate FinFET and conventional sub-22 nm silicon FET, the gate-all-around technique used in the carbon nanotube field-effect transistors downplays other transistors in terms of power consumption and reliability.

Techniques:

Simulated virtual source carbon nanotube field effect transistor: ( a ) 3D structure of the VS-CNTFET structure implemented in the SILVACO Atlas TCAD tool, ( b ) cross sectional view of the CNTFET where the 4H-SiC has the property of semiconducting carbon nanotubes, ( c ) cross sectional view of FinFET and ( d ) I–V characteristics extracted from the device.

Journal: Sensors (Basel, Switzerland)

Article Title: Design and Analysis of Soft Error Rate in FET/CNTFET Based Radiation Hardened SRAM Cell

doi: 10.3390/s22010033

Figure Lengend Snippet: Simulated virtual source carbon nanotube field effect transistor: ( a ) 3D structure of the VS-CNTFET structure implemented in the SILVACO Atlas TCAD tool, ( b ) cross sectional view of the CNTFET where the 4H-SiC has the property of semiconducting carbon nanotubes, ( c ) cross sectional view of FinFET and ( d ) I–V characteristics extracted from the device.

Article Snippet: Compared to the multigate FinFET and conventional sub-22 nm silicon FET, the gate-all-around technique used in the carbon nanotube field-effect transistors downplays other transistors in terms of power consumption and reliability.

Techniques: